Defects at the Nanoscale Impact Contact Line Motion at all Scales - Perrin, Hugo and Lhermerout, Romain and Davitt, Kristina and Rolley, Etienne and Andreotti, Bruno PHYSICAL REVIEW LETTERS116, (2016)
A moving contact line as a rheometer for nanometric interfacial layers - Lhermerout, Romain and Perrin, Hugo and Rolley, Etienne and Andreotti, Bruno and Davitt, Kristina NATURE COMMUNICATIONS7, (2016)
